Our principal role has been providing users with the best possible analytical precision and accuracy for micro- and nanoscale isotopic analysis using secondary ion mass spectrometry (SIMS). Over the past three decades, we have striven to create a world-leading facility at UCLA for in situ microscale isotopic analyses of geologic materials and to provide access to its capabilities to the broader community to address important problems in Earth and planetary science. Our work includes geochronology, stable isotopic, and trace element analyses of a wide variety of natural and synthetic materials. 

The UCLA SIMS (a CAMECA ims-1290 and 1270) is partly supported by the NSF Instrumentation and Facilities Program.